Researchers from the Department of Energy's SLAC National Accelerator Laboratory and the University of California, Los ...

Secondary electron emission (SEE) is a fundamental physical process whereby incident electrons or photons induce the ejection of electrons from a material’s surface. This phenomenon has significant ...

Some of you probably know this already, but there’s actually more than one kind of electron microscope. In electronics work, the scanning electron microscope (SEM) is the most common. You hit ...

Scientists have used a new scanning electron microscopy technique to resolve the unique atomic structure at the surface of a material. This new technique holds promise for the study of catalysis, ...

This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of 1.2 nm. It is fully digital and incorporates an image archiving computer.

Proceedings of the Royal Society of London. Series A, Containing Papers of a Mathematical and Physical Character, Vol. 139, No. 838 (Feb. 1, 1933), pp. 436-447 (12 pages) ...

Efficiently identify and map tire fillers with streamlined material analysis—explore the details in this application note.

The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on ...